The Materials Research Facility provides a centralized location for analytical instrumentation to support faculty research efforts in the College of Science and Technology. Located in Beury Hall, this facility houses three X-Ray Diffractometers, Microprobe, TEM and Raman Spectrometer. For more information please contact Dr. Zhou.
Agilent 6520B Accurate-Mass Q-TOF LC/MS
The Agilent 6520B Accurate-Mass Q-TOF LC/MS system is capable to achieve sub 1 ppm mass accuracy and picogram sensitivity. The high mass accuracy improves confidence and reduces false positives. The high picogram sensitivity enables identification of very low-abundance compounds. The wide mass range to 20,000 m/z allows identifying and quantifying both low molecular weight compounds and biomolecules. The ion interface can be chosen between a Dual ESI sprayer and an APCI sprayer. The system has installed AgilentŐs Qualitative and Quantitative Analysis software, Spectrum Mill, Mass Profiler Professional, MassHunter Bioconfirm packages and METLIN Metabolite database. The system empowers users to enter new applications frontiers such as drug discovery, protein, peptide, and metabolites identification, and environmental studies such as food and water trace contaminations.
The 8500 FE-SEM offers several imaging techniques for enhancing surface contrast and allowing nanoscale features to be observed on a wide variety of nanostructured materials, including polymers, thin fi lms, biomaterials, and other energy-sensitive samples on any substrate, even glass.
Bruker APEX II DUO X-ray Diffractometer
The Bruker APEX II DUO X-ray diffractometer is designed for structural determination of single crystals of small molecules (typically less than 500 non-hydrogen atoms). The diffractometer combines a molybdenum X-ray source for high throughput and charge density experiments, and a copper source for absolute configuration and protein screening. The APEX2 software has a graphical user interface that guides the user through the complete experiment and analysis, from data acquisition through data collection, integration and scaling to structure solution and refinement and report generation.
The Bruker D8 Discover X-ray diffractometer at CST of Temple University is optimized for determination of thin film structures. Common applications include grazing-incidence XRD (GIXD), X-Ray Reflectivity (XRR), X-ray rocking curve analysis, reciprocal space maps, texture (pole figure) and residual stress analysis. The D8 Discover diffractometer can also be reconfigured for small-angle X-ray scattering applications.
The JASCO Ventuno21 Micro-Raman Spectrometer is suitable for chemical composition analysis of polymers, minerals, ceramics, cells and proteins in a microscopic scale. The spatial resolution of the instrument is 1 µm. The excitation source is an argon laser of 514.5 nm in wavelength. Compared with FT-IR, the sample preparation for Raman is easier and most samples can be measured “as-is”.
The JEOL JEM-1400 at College of Science and Technology of Temple University is a 120kV class TEM equipped with STEM units and an EDS analyzer. It is suitable for biological, polymer and materials science applications. The TEM offers high resolution (0.2 nm) and high contrast imaging capabilities and the STEM/EDS offer point analysis (2.0 nm) and elemental mapping capabilities. The instrument comes with a standard sample holder for routine measurements at room temperature, a liquid nitrogen transfer holder for CRYO-TEM, and a heating holder that allows the direct observation of microstructural phase changes, nucleation, growth and dissolution processes. Click here for more
The JEOL JXA-733 microprobe is designed for non-destructive quantitative elemental analysis and secondary electron (SE), backscattered electron (BSE) imaging of solid materials. The instrument is equipped with three 2-crystal wavelength dispersive spectrometers (WDS) and one energy-dispersive X-ray spectrometer (EDS). Most of the periodic table can in principle be analyzed (5B through 92U). The detection limits are typically several hundred ppm for well-prepared samples. The spatial resolution is ca. 2 µm, 100 nm, and 7 nm for X-ray mapping, BSE imaging, and SE imaging, respectively.
The Rigaku D/max-B powder X-ray diffractometer is used for phase identification, quantitative phase analysis, measurement of crystal grain size and crystal distortions, and crystallinity analysis of polycrystalline materials, as well as radial distribution analysis of non-crystalline materials. An automatic sample changer that holds up to 39 samples is installed with the diffractometer for efficient, fully automated data acquisition. Data processing and analysis are performed using JADE 9.0 software package.